Analysis of Diamond Thin Films Using Quesant Atomic Force Microscope

Abstract

Abstract : The Atomic Force Microscope AFM is an excellent tool in generating three-dimensional images of surfaces. Description of the principle and structure of the AFM is given. Details concerning the alignment of the AFM, positioning, approaching, engaging, and scanning the sample have been stated. The extreme properties of diamond that make it technologically attractive are stated. Images from the AFM, optical microscope, and SEM showed that diamond particles have different shapes, zises, and clustering density when different areas on a film were scanned. It has been found that the roughness value of the polished areas could be lower than 30 nm. In fact, the convolution between the tip and surface features may distort the image. Finally, the effect of etching method on the morphology of semiconductors surfaces has been investigated.