Analysis of Diamond Thin Films Using Quesant Atomic Force Microscope

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AuthorJasim, Khalil Ebrahim
metadata.dc.contributor.departmentHeriot-Watt University, Physics Department
metadata.dc.date.accessioned2026-09-20T15:50:51Z
Publication date1996
Degree levelMaster
AbstractAbstract : The Atomic Force Microscope AFM is an excellent tool in generating three-dimensional images of surfaces. Description of the principle and structure of the AFM is given. Details concerning the alignment of the AFM, positioning, approaching, engaging, and scanning the sample have been stated. The extreme properties of diamond that make it technologically attractive are stated. Images from the AFM, optical microscope, and SEM showed that diamond particles have different shapes, zises, and clustering density when different areas on a film were scanned. It has been found that the roughness value of the polished areas could be lower than 30 nm. In fact, the convolution between the tip and surface features may distort the image. Finally, the effect of etching method on the morphology of semiconductors surfaces has been investigated.
metadata.dc.identifier.otherDrupal node 4385
metadata.dc.identifier.otherhttps://digitalrepository.uob.edu.bh/en/dar/analysis-diamond-thin-films-using-quesant-atomic-force-microscope
metadata.dc.identifier.urihttp://165.227.56.122/handle/123456789/7090
Languageen
Linkhttps://digitalrepository.uob.edu.bh/en/_flysystem/fedora/2025-08/001770_msc_in_optoelectronics_and_laser_devices_heriot-watt_-_st._andrews_universities_1995_-_96.pdf
SubjectDiamond thin films--Dissertations
SubjectDiamonds, Artifical--Dissertations
TitleAnalysis of Diamond Thin Films Using Quesant Atomic Force Microscope
TypeMaster's Thesis

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